46 Patents
- US126144032026Automated Generation of Training Data Comprising Document Images and Associated Label Data
Oracle International Corporation
0 cites - US125619982026Synthetic Data Fine-tuned Optical Character Recognition Engine for Extensible Markup Language Document Reconstruction
ORACLE INTERNATIONAL CORPORATION
0 cites - US124940022025Synthetic Table Generation Pipeline for Training Deep Table Extraction Models
Oracle International Corporation
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- US124513802025Semiconductor Fabrication Using Process Control Parameter Matrix
Applied Materials, Inc.
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- US123710252025Autonomous Lane Change Method and Apparatus, and Storage Medium
Huawei Technologies Co., Ltd.
0 cites - US123741392025Generating Synthetic Training Data Including Document Images with Key-value Pairs
ORACLE INTERNATIONAL CORPORATION
0 cites - US123706462025Polishing Apparatus Using Machine Learning and Compensation for Pad Thickness
Applied Materials, Inc.
0 cites - 0 cites
- US123548712025Ultrathin Atomic Layer Deposition Film Accuracy Thickness Control
Lam Research Corporation
0 cites - US122720472025Residue Measurement from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - US122610382025Gapfill of Variable Aspect Ratio Features with a Composite PEALD and PECVD Method
Lam Research Corporation
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- US122491702025Vision-based Document Language Identification by Joint Supervision
Oracle International Corporation
0 cites - US122300202025Techniques for Dynamic Time-based Custom Model Generation
Oracle International Corporation
0 cites - US121699252024System Using Film Thickness Estimation from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - US121365742024Technique for Training Neural Network for Use in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites - US120994362024Application Performance Monitoring for Monolithic Applications and Distributed Systems
Oracle International Corporation
0 cites - US120905992024Determination of Substrate Layer Thickness with Polishing Pad Wear Compensation
Applied Materials, Inc.
0 cites - US120778592024Variable Cycle and Time RF Activation Method for Film Thickness Matching in a Multi-station Deposition System
Lam Research Corporation
0 cites - US120573542024Trained Neural Network in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites - US120201592024Training Spectrum Generation for Machine Learning System for Spectrographic Monitoring
Applied Materials, Inc.
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- US119197482024Hoist for Transferred Materials in Underground Auxiliary Transportation System and Method Thereof
XUZHOU COAL MINE SAFETY EQUIPMENT MANUFACTURE CO., Ltd.
0 cites - US118477762023System Using Film Thickness Estimation from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - 0 cites
- US118369132023Film Thickness Estimation from Machine Learning Based Processing of Substrate Images
Applied Materials, Inc.
0 cites - 0 cites
- US117912242023Technique for Training Neural Network for Use in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites - US117800472023Determination of Substrate Layer Thickness with Polishing Pad Wear Compensation
Applied Materials, Inc.
0 cites - USD09949922023Pet Playpen0 cites
- USD09942302023Pet Playpen0 cites
- US116995952023Imaging for Monitoring Thickness in a Substrate Cleaning System
Applied Materials, Inc.
0 cites - 0 cites
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- US116580782023Using a Trained Neural Network for Use in In-situ Monitoring During Polishing and Polishing System
Applied Materials, Inc.
0 cites - US116512072023Training Spectrum Generation for Machine Learning System for Spectrographic Monitoring
Applied Materials, Inc.
0 cites - US116461982023Ultrathin Atomic Layer Deposition Film Accuracy Thickness Control
Lam Research Corporation
0 cites - 0 cites