Julie A. Campbell

7 Patents

• US125718162026

  High-impedance Differential Flexible Probe Tip

  Tektronix, Inc.

  0 cites
• US124930532025

  Precision, High Bandwidth, Switching Attenuator

  TEKTRONIX, Inc.

  0 cites
• US123322772025

  Thermal Management System for a Test-and-measurement Probe

  Tektronix, Inc.

  0 cites
• US120555782024

  Securing a Probe to a Device Under Test

  Tektronix, Inc.

  0 cites
• US118155482023

  Test and Measurement Instrument Accessory with Reconfigurable Processing Component

  Tektronix, Inc.

  0 cites
• US118087862023

  Precision, High Bandwidth, Switching Attenuator

  Tektronix, Inc.

  0 cites
• US115789252023

  Thermal Management System for a Test-and-measurement Probe

  Tektronix, Inc.

  0 cites