Patents/Inventors

Juan Jose Faria Briceno

Albuquerque, NMUS1 patent

2 Patents

US124165802025
Method and System for In-line Optical Scatterometry
UNM RAINFOREST INNOVATIONS
0 cites
US123991202025
In-line Angular Optical Multi-point Scatterometry for Nanomanufacturing Systems
UNM RAINFOREST INNOVATIONS
0 cites