8 Patents
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- US122781422025Method for Manfacturing Semiconductor Device for Reducing Partcle-induced Defects
NANYA TECHNOLOGY CORPORATION
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- US122117392025Method for Manufacturing Semiconductor Device Comprising Contact Void Surrounding Bit Line
NANYA TECHNOLOGY CORPORATION
0 cites - 0 cites
- US118324372023Semiconductor Memory Device with Air Gaps for Reducing Current Leakage
NANYA TECHNOLOGY CORPORATION
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