3 Patents
- US125553722026Image Sensor Evaluation Method Using Computing Device Including Processor
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122365672025Image Evaluation Method That Can Quantify Images Distorted by Artifacts, Computer Program Performing the Method, and Computing Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122192992025Method of Operating Assessment Device Assessing Color Distortion of Image Sensor
SAMSUNG ELECTRONICS CO., Ltd.
0 cites