6 Patents
- US118566782023Method of Measuring a Graphite Article, Apparatus for a Measurement, and Ingot Growing System
SENIC Inc.
0 cites - 0 cites
- 0 cites
- US117086442023Method for Preparing Sic Ingot, Method for Preparing Sic Wafer and the Sic Wafer Prepared Therefrom
SENIC Inc.
0 cites - 0 cites
- US115663442023Silicon Carbide Ingot, Wafer, Method for Producing a Silicon Carbide Ingot, and Method for Manufacturing a Wafer
SENIC Inc.
0 cites