Jong Seok Jung

5 Patents

• US126091782026

  Test Circuit and Semiconductor Memory System Including the Test Circuit

  SK Hynix Inc.

  0 cites
• US124494482025

  Semiconductor Device Having Shielding Structure

  SK Hynix Inc.

  0 cites
• US122983442025

  Leakage Current Detection Circuit

  SK Hynix Inc.

  0 cites
• US122835332025

  Test Circuit of Semiconductor Apparatus and Test System Including the Same

  SK Hynix Inc.

  0 cites
• US117749972023

  Semiconductor Device for Generating a Reference Current or Voltage in Various Temperatures

  SK Hynix Inc.

  0 cites