Jong Hyeon Woo

2 Patents

• US122345552025

  Substrate Treating Apparatus and Filler Member Provided Therein

  SEMES CO., Ltd.

  0 cites
• US120610972024

  Substrate Type Sensor for Measuring Horizontality of Substrate Support Member Provided in Atmosphere Accompanied by Temperature Change, Method for Measuring Horizontality of Substrate Support Member by Using the Same, and Non-transitory Computer Readable Medium

  SEMES CO., Ltd.

  0 cites