Patents/Inventors

Jonathan L. Herlocker

Seattle, WAUS2 patents

3 Patents

US124697252025
Method for Determining Corrective Film Pattern to Reduce Semiconductor Wafer Bow
Delta Design, Inc.
0 cites
US120317332024
Method for Physical System Anomaly Detection
Tignis, Inc.
0 cites
US116308202023
Analysis of Time Series Sensor Measurements in Physical Systems
Tignis, Inc.
0 cites