3 Patents
- US124052232025Matrix-based Characterization and Measurements for Semiconductor Thin-film Material
The Board Of Trustees Of The Leland Stanford Junior University
0 cites - US118415182023High-efficiency, Large-area, Topology-optimized Metasurfaces
The Board Of Trustees Of The Leland Stanford Junior University
0 cites - US115436532023Device Components Formed of Geometric Structures
The Board Of Trustees Of The Leland Stanford Junior University
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