4 Patents
- 0 cites
- US120682382024Back-end-of-line (BEOL) High Resistance (hi-r) Conductor Layer in a Metal Oxide Metal (MOM) Capacitor
QUALCOMM Incorporated
0 cites - 0 cites
- US119424142024Integrated Circuits (ics) Employing Directly Coupled Metal Lines Between Vertically-adjacent Interconnect Layers for Reduced Coupling Resistance, and Related Methods
QUALCOMM Incorporated
0 cites