Patents/Inventors

John J. Pickerd

Hillsboro, ORUS21 patents

17 Patents

US125961452026
Optical Tuning Test System Using Parallel Oven Pipelines with Parallel Instrument Channels and Machine Learning Assistance
Tektronix, Inc.
0 cites
US125831222026
Automated Cavity Filter Tuning Using Machine Learning
Tektronix, Inc.
0 cites
US125718412026
General Digital Signal Processing Waveform Machine Learning Control Application
Tektronix, Inc.
0 cites
US125730212026
Ultrasonic Defect Detection and Classification System Using Machine Learning
Sonix, Inc.
0 cites
US125055322025
Method and Apparatus for Automated Defect Detection
Sonix, Inc.
0 cites
US124428522025
Tuning a Device Under Test Using Parallel Pipeline Machine Learning Assistance
Tektronix, Inc.
0 cites
US123794142025
System and Method for Multi-level Signal Cyclic Loop Image Representations for Measurements and Machine Learning
Tektronic, Inc.
0 cites
US123282422025
Eye Classes Separator with Overlay, and Composite, and Dynamic Eye-trigger for Humans and Machine Learning
Tektronix, Inc.
0 cites
US122651252025
System and Method for Separation and Classification of Signals Using Cyclic Loop Images
Tektronix, Inc.
0 cites
US121469142024
Bit Error Ratio Estimation Using Machine Learning
Tektronix, Inc.
0 cites
US120926922024
Cyclic Loop Image Representation for Waveform Data
Tektronix, Inc.
0 cites
US120855902024
Swept Parameter Oscilloscope
Tektronix, Inc.
0 cites
US119408892024
Combined TDECQ Measurement and Transmitter Tuning Using Machine Learning
Tektronix, Inc.
0 cites
US119238952024
Optical Transmitter Tuning Using Machine Learning and Reference Parameters
Tektronix, Inc.
0 cites
US119238962024
Optical Transceiver Tuning Using Machine Learning
Tektronix, Inc.
0 cites
US119070902024
Machine Learning for Taps to Accelerate TDECQ and Other Measurements
Tektronix, Inc.
0 cites
US115988052023
Low Frequency S-parameter Measurement
Tektronix, Inc.
0 cites