Patents/Inventors

John J. Hench

Los Gatos, CAUS2 patents

3 Patents

US124493862025
Forward Library Based Seeding for Efficient X-ray Scatterometry Measurements
KLA Corporation
0 cites
US123796682025
Methods and Systems for Measurement of Semiconductor Structures with Multi-pass Statistical Optimization
KLA Corporation
0 cites
US123207632025
Full Beam Metrology for X-ray Scatterometry Systems
KLA Corporation
0 cites