John J. Albers

2 Patents

• US119759632024

  Microelectromechanical Systems (“MEMS”) Device Having a Built-in Self-test (“BIST”) and a Method of Application of a BIST to Measure MEMS Health

  0 cites
• US118387082023

  Non-planar Ingress Protection Element for a Sensor Device

  KNOWLES ELECTRONICS, LLC

  0 cites