9 Patents
- US125623382026Method of Determining an Energy Spectrum or Energy Width of a Charged Particle Beam, and Charged Particle Beam Imaging Device
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US124513222025Method of Forming a Multipole Device, Method of Influencing an Electron Beam, and Multipole Device
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US124127272025Charged Particle Beam System, Corrector for Aberration Correction of a Charged Particle Beam, and Method Thereof
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US123861642025Method of Determining a Brightness of a Charged Particle Beam, Method of Determining a Size of a Source of the Charged Particle Beam, and Charged Particle Beam Imaging Device
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US123082032025Methods of Determining Aberrations of a Charged Particle Beam, and Charged Particle Beam System
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US118172922023Primary Charged Particle Beam Current Measurement
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US118107532023Methods of Determining Aberrations of a Charged Particle Beam, and Charged Particle Beam System
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US117911282023Method of Determining the Beam Convergence of a Focused Charged Particle Beam, and Charged Particle Beam System
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
0 cites - US115453382023Charged Particle Beam Apparatus and Method of Controlling Sample Charge
ICT Integrated Circuit Testing Gesellschaft Für Halbleiterriftechnik Mbh
0 cites