9 Patents
- US124068442025Wafer Having a Silicon Carbide Crystal Layer with Stacking Faults Provided on a Silicon Carbide Base Body and Semiconductor Device Manufactured Using the Wafer
KABUSHIKI KAISHA TOSHIBA
0 cites - US121487992024Semiconductor Device, Method for Manufacturing Semiconductor Device, Inverter Circuit, Drive Device, Vehicle, and Elevator
KABUSHIKI KAISHA TOSHIBA
0 cites - 0 cites
- US118482112023Semiconductor Device, Method for Manufacturing Semiconductor Device, Inverter Circuit, Drive Device, Vehicle, and Elevator
Kabushiki Kaisha Toshiba
0 cites - US117640592023Method for Manufacturing Substrate, Method for Manufacturing Semiconductor Device, Substrate, and Semiconductor Device
KABUSHIKI KAISHA TOSHIBA
0 cites - US117642692023Semiconductor Device, Semiconductor Device Manufacturing Method, Inverter Circuit, Driver Device, Vehicle, and Elevator
KABUSHIKI KAISHA TOSHIBA
0 cites - US117642702023Semiconductor Device, Method for Manufacturing Semiconductor Device, Inverter Circuit, Drive Device, Vehicle, and Elevator
KABUSHIKI KAISHA TOSHIBA
0 cites - US116211672023Semiconductor Device, Method for Manufacturing Semiconductor Device, Inverter Circuit, Drive Device, Vehicle, and Elevator
Kabushiki Kaisha Toshiba
0 cites - 0 cites