Johannes Catharinus Hubertus Mulkens

6 Patents

• US125000632025

  Method and Apparatus for Inspection

  ASML NETHERLANDS B.V.

  0 cites
• USRE0505712025

  Lithographic Apparatus, Device Manufacturing Method, and Method of Correcting a Mask

  ASML NETHERLANDS B.V.

  0 cites
• US120673402024

  Computational Wafer Inspection

  ASML NETHERLANDS B.V.

  0 cites
• US118759662024

  Method and Apparatus for Inspection

  ASML NETHERLANDS B.V.

  0 cites
• US118605482024

  Method for Characterizing a Manufacturing Process of Semiconductor Devices

  ASML NETHERLANDS B.V.

  0 cites
• US116095042023

  Lithographic Apparatus and Device Manufacturing Method

  ASML NETHERLANDS B.V.

  0 cites