Patents/Inventors

Jiwon Yeom

DaejeonKR1 patent

2 Patents

US123859462025
Method of Inspecting Tip of Atomic Force Microscope and Method of Manufacturing Semiconductor Device
KOREA ADVANCED INSTITUTE OF SCIENCE AND Technology
0 cites
US120926562024
Test Apparatus and Test Method Thereof
SAMSUNG ELECTRONICS CO., Ltd.
0 cites