Patents/Inventors

Jinxin Fu

Santa Clara, CAUS36 patents

33 Patents

US125785272026
Reconfigurable Optical Interconnects for Co-packaged Devices Including Photonic Integrated Circuits
Applied Materials, Inc.
0 cites
US125812712026
Movement Track Generation Method and Apparatus
Nokia Technologies Oy
0 cites
US125605102026
Methods of Geometry Parameters Measurement for Optical Gratings
Applied Materials, Inc.
0 cites
US124168582025
Optical Device with Elements Having Outwardly-curved Opposing Leading Edges Spaced According to a Duty Cycle, Pitch, and Critical Dimension
Applied Materials, Inc.
0 cites
US123989982025
Methods for High-resolution, Stable Measurement of Pitch and Orientation in Optical Gratings
Applied Materials, Inc.
0 cites
US123930252025
Waveguide Combiners Having Arrangements for Image Uniformity
Applied Materials, Inc.
0 cites
US123861552025
Ultra-wide Angle Lens Systems with External Pupil
Applied Materials, Inc.
0 cites
US123786622025
Ion Implantation to Modify Glass Locally for Optical Devices
Applied Materials, Inc.
0 cites
US123792802025
Method of Measuring Efficiency for Optical Devices
Applied Materials, Inc.
0 cites
US122494892025
Optical Device Improvement
Applied Materials, Inc.
0 cites
US122365752025
In-line Metrology Systems, Apparatus, and Methods for Optical Devices
Applied Materials, Inc.
0 cites
US122299402025
In-line Metrology Systems, Apparatus, and Methods for Optical Devices
Applied Materials, Inc.
0 cites
US122037472025
Interference In-sensitive Littrow System for Optical Device Structure Measurement
Applied Materials, Inc.
0 cites
US121653412024
Optical Resolution Measurement Method for Optical Devices
Applied Materials, Inc.
0 cites
US121593922024
Die System and Method of Comparing Alignment Vectors
Applied Materials, Inc.
0 cites
US121533442024
Lithography Method to Form Structures with Slanted Angle
APPLIED MATERIALS, Inc.
0 cites
US121404942024
Method to Measure Light Loss of Optical Films and Optical Substrates
APPLIED MATERIALS, Inc.
0 cites
US120854752024
Method to Determine Line Angle and Rotation of Multiple Patterning
Applied Materials, Inc.
0 cites
US120503272024
Imaging System and Method of Manufacturing a Metalens Array
Applied Materials, Inc.
0 cites
US120192422024
Full-field Metrology Tool for Waveguide Combiners and Meta-surfaces
Applied Materials, Inc.
0 cites
US120211022024
Imaging System and Method of Creating Composite Images
Applied Materials, Inc.
0 cites
US120038412024
Edge Inspection System for Inspection of Optical Devices
Applied Materials, Inc.
0 cites
US119885742024
Illumination System for AR Metrology Tool
Applied Materials, Inc.
0 cites
US119781962024
See-through Metrology Systems, Apparatus, and Methods for Optical Devices
0 cites
US119137762024
Interference In-sensitive Littrow System for Optical Device Structure Measurement
Applied Materials, Inc.
0 cites
US118923672024
Method to Measure Light Loss of Optical Films and Optical Substrates
APPLIED MATERIALS, Inc.
0 cites
US118735542024
Ion Implantation to Modify Glass Locally for Optical Devices
Applied Materials, Inc.
0 cites
US118517402023
PVD Directional Deposition for Encapsulation
Applied Materials, Inc.
0 cites
US118027912023
Optical Device Metrology Systems and Related Methods
Applied Materials, Inc.
0 cites
US117549192023
Lithography Method to Form Structures with Slanted Angle
APPLIED MATERIALS, Inc.
0 cites
US117488752023
See-through Metrology Systems, Apparatus, and Methods for Optical Devices
Applied Materials, Inc.
0 cites
US116109252023
Imaging System and Method of Creating Composite Images
Applied Materials, Inc.
0 cites
US115654892023
Wetting Layers for Optical Device Enhancement
Applied Materials, Inc.
0 cites