Patents/Inventors

Jinwoo Ahn

Suwon-siKR5 patents

4 Patents

US125781782026
Pupil Image Measuring Device and Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US125605292026
Imaging Ellipsometer and Method of Measuring an Overlay Error Using the Same
Samsung Electronics Co., Ltd.
0 cites
US121112702024
Method of Inspecting a Wafer and Apparatus for Performing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US119212702024
Inspection System Including Reference Specimen and Method of Forming Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites