Patents/Inventors

Jinseob Kim

Suwon-siKR7 patents

7 Patents

US124552282025
Semiconductor Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites
US124222452025
Semiconductor Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites
US123470962025
Semiconductor Measurement Apparatus
Samsung Electronics Co., Ltd.
0 cites
US122284992025
Pupil Ellipsometry Measurement Apparatus and Method and Method of Fabricating Semiconductor Device Using the Pupil Ellipsometry Measurement Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US120026982024
Metrology Apparatus and Method Based on Diffraction Using Oblique Illumination and Method of Manufacturing Semiconductor Device Using the Metrology Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US118989122024
Hyperspectral Imaging (HSI) Apparatus and Inspection Apparatus Including the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US116041362023
Pupil Ellipsometry Measurement Apparatus and Method and Method of Fabricating Semiconductor Device Using the Pupil Ellipsometry Measurement Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites