3 Patents
- US122242822025Integrated Circuit Device Including Metal-oxide Semiconductor Transistors
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US120926762024Semiconductor Device and Method for Improved Antenna Testing
JCET STATS Chippac Korea Limited
0 cites - US116997002023Integrated Circuit Device Including Metal-oxide Semiconductor Transistors
SAMSUNG ELECTRONICS CO., Ltd.
0 cites