Patents/Inventors

Jinde Gao

ShanghaiCN5 patents

4 Patents

US125801512026
Method for Preparing TEM Sample
Shanghai Huali Integrated Circuit Corporation
0 cites
US125060392025
Failure Analysis and Location Method for Short Circuit Structure
Shanghai Huali Integrated Circuit Corporation
0 cites
US123392022025
Method of Failure Analysis for Defect Locations
Shanghai Huali Integrated Circuit Corporation
0 cites
US118526742023
Method for Locating Open Circuit Failure Point of Test Structure
Shanghai Huali Microelectronics Corporation
0 cites