Patents/Inventors

Jile Jiang

BeijingCN1 patent

2 Patents

US124164902025
Method and Chemical Mechanical Planarization Device for In-situ Measurement of Film Thickness
BEIJING TSD SEMICONDUCTOR CO., Ltd.
0 cites
US123973942025
Method and Device for Determining Parameters of Near-surface Dielectric Layer in Wafer Grinding Scene
BEIJING TSD SEMICONDUCTOR CO., Ltd.
0 cites