Patents/Inventors

Jiebin Duan

ShanghaiCN2 patents

3 Patents

US123425502025
Memory Array Structure
SHANGHAI IC R&D CENTER CO., Ltd
0 cites
US122887252025
Critical Dimension Error Analysis Method
SHANGHAI IC R&D CENTER CO., Ltd.
0 cites
US119425052024
Pixel Structure of Stacked Image Sensor and Preparation Method Thereof
CHENGDU IMAGE DESIGN TECHNOLOGY Co. Ltd.
0 cites