7 Patents
- US126088332026Three-dimensional Measurement Method Based on End-to-end Deep Learning for Speckle Projection
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US125663242026Inverted Microscopic Imaging System with Programmable LED Array for Multi-contrast Label-free Imaging
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US118937192024Single-shot Differential Phase Contrast Quantitative Phase Imaging Method Based on Color Multiplexed Illumination
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US118085642023Calibration Method for Fringe Projection Systems Based on Plane Mirrors
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US1178196620233D Diffraction Tomography Microscopy Imaging Method Based on LED Array Coded Illumination
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US116504062023Microscopic Imaging Method of Phase Contrast and Differential Interference Contrast Based on the Transport of Intensity Equation
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US115559922023Programmable Annular Led Illumination-based High Efficiency Quantitative Phase Microscopy Imaging Method
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites