Patents/Inventors

Jiao Liang

San Jose, CAUS2 patents

3 Patents

US123395912025
Determining Metrics for a Portion of a Pattern on a Substrate
ASML NETHERLANDS B.V.
0 cites
US121829832024
Utilize Machine Learning in Selecting High Quality Averaged SEM Images from Raw Images Automatically
ASML NETHERLANDS B.V.
0 cites
US115674132023
Method for Determining Stochastic Variation of Printed Patterns
ASML NETHERLANDS B.V.
0 cites