13 Patents
- US123160992025Protection Circuit for High Temperature Reverse Bias Test
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., Ltd.
0 cites - US122059452025Semiconductor Device and Manufacturing Method Thereof
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US121742292024Apparatus for Measuring Dynamic On-resistance of Nitride-based Semiconductor Device
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US121767032024Terminal Protection Network and Electronic Device
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., Ltd.
0 cites - US120948752024Nitride-based Semiconductor Device and Method for Manufacturing the Same
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US120465932024Semiconductor Device and Manufacturing Method Thereof
INNOSCIENCE (SUZHOU) TECHNOLOGY CO., Ltd.
0 cites - US120468952024Method for Wafer-level Adjustment of Protection Circuits of Electronic Devices and a Wafer for Facilitating the Same
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., Ltd.
0 cites - US120275142024Clamping Circuit Integrated on Gallium Nitride Semiconductor Device and Related Semiconductor Device
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US118698872024Semiconductor Device and Manufacturing Method Thereof0 cites
- US117642102023Electrostatic Protection Circuit and Electronic Device
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US117219692023Electronic Device and Over Current Protection Circuit
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites - US117159462023Electronic Device and Electrostatic Discharge Protection Circuit
INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., Ltd.
0 cites - US116006102023Clamping Circuit Integrated on Gallium Nitride Semiconductor Device and Related Semiconductor Device
INNOSCIENCE (ZHUHAI) TECHNOLOGY CO., Ltd.
0 cites