2 Patents
- US118924712024Method and Device for Simultaneous Independent Motion Measurement of Multiple Probes in Atomic Force Microscope
SHENYANG INSTITUTE OF AUTOMATION, CHINESE ACADEMY OF SCIENCES
0 cites - US117890372023Integrated Dual-probe Rapid In-situ Switching Measurement Method and Device of Atomic Force Microscope
SHENYANG INSTITUTE OF AUTOMATION, CHINESE ACADEMY OF SCIENCES
0 cites