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Inventors
Jiahong Wu
Yokkaichi
JP
4 patents
5 Patents
US12472533
2025
Impurity Recovery Device and Impurity Recovery Method
Kioxia Corporation
0 cites
US11923138
2024
Collecting Device and Collecting Method
KIOXIA CORPORATION
0 cites
US11837510
2023
Method for Analyzing Silicon Substrate
KIOXIA CORPORATION
0 cites
US11640903
2023
Analysis Apparatus and Analysis Method
KIOXIA CORPORATION
0 cites
US11607750
2023
Analysis Apparatus and Analysis Method
KIOXIA CORPORATION
0 cites