Patents/Inventors

Jeseung Lee

Anyang-siKR4 patents

4 Patents

US126074612026
Apparatus for Ultrasonically Measuring Thin Film Thickness with Retroreflector and Method Thereof
CENTER FOR ADVANCED META-MATERIALS
0 cites
US126096742026
Full Transmission Device for Wide-angle Mode Conversion of Elastic Waves
CENTER FOR ADVANCED META-MATERIALS
0 cites
US125781872026
Apparatus for Ultrasonically Measuring Thin Film Thickness with Retroreflector and Method Thereof
CENTER FOR ADVANCED META-MATERIALS
0 cites
US122663332025
Matching Media for Perfect Transmission of Ultrasonic Waves
CENTER FOR ADVANCED META-MATERIALS
0 cites