Jeroen Cottaar

5 Patents

• US124168702025

  Measuring Method and Measuring Apparatus

  ASML Netherlands B.V.

  0 cites
• US120319092024

  Metrology Method for Measuring an Exposed Pattern and Associated Metrology Apparatus

  ASML Netherlands B.V.

  0 cites
• US119829462024

  Metrology Targets

  ASML HOLDING N.V.

  0 cites
• US118090882023

  Method for Controlling a Lithographic Apparatus

  ASML NETHERLANDS B.V.

  0 cites
• US116362472023

  Three-dimensional Master Equation Simulations of Charge-carrier Transport and Recombination in Organic Semiconductor Materials and Devices

  Simbeyond Holding B.V.

  0 cites