Jeongjin Lee

7 Patents

• US125936602026

  Method of Manufacturing Semiconductor Device

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US125851992026

  Overlay Correction Method, and Exposure Method and Semiconductor Device Manufacturing Method Including Overlay Correction Method

  Samsung Electronics Co., Ltd.

  0 cites
• US125637432026

  Semiconductor Device Having Improved Device Bonding Features, Performance and Reliability

  Samsung Electronics Co., Ltd.

  0 cites
• US123951612025

  Flip-flop Based on Clock Signal and Pulse Signal

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US119278792024

  Extreme Ultraviolet (EUV) Photomask and Method of Manufacturing Semiconductor Device Using the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US119214212024

  Overlay Correcting Method, and Photolithography Method, Semiconductor Device Manufacturing Method and Scanner System Based on the Overlay Correcting Method

  Samsung Electronics Co., Ltd.

  0 cites
• US117969232023

  Overlay Correction Method, Method of Evaluating Overlay Correction Operation, and Method of Fabricating Semiconductor Device Using the Overlay Correction Method

  Samsung Electronics Co., Ltd.

  0 cites