Patents/Inventors

Jeongho Ahn

Suwon-siKR5 patents

6 Patents

US126075732026
Defect Inspection Device and Defect Inspection Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US124876532025
Method for Controlling Electronic Devices and Electronic Device Thereof
Samsung Electronics Co., Ltd.
0 cites
US124361062025
Apparatus and Method for Inspecting Semiconductor Device
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US121302422024
Inspection System of Semiconductor Wafer and Method of Driving the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US117545102023
Inspection System of Semiconductor Wafer and Method of Driving the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US116783902023
Electronic Device for Performing Wireless Communication and Wireless Communication Method
Samsung Electronics Co., Ltd.
0 cites