Patents/Inventors

Jeong Kyun Yim

Anyang-siKR3 patents

4 Patents

US120400402024
NPU Capable of Testing Component Including Memory During Runtime
DEEPX CO., Ltd.
0 cites
US120337132024
NPU Capable of Testing Component Therein During Runtime, the Testing Including Function Test
DEEPX CO., Ltd.
0 cites
US119902032024
Neural Processing Unit Capable of Testing Component Therein During Runtime
DEEPX CO., Ltd.
0 cites
US116518352023
NPU Capable of Testing Component Therein During Runtime
DEEPX CO., Ltd.
0 cites