Patents/Inventors

Jens Timo Neumann

AalenDE8 patents

8 Patents

US125575882026
Methods of Cross-section Imaging of an Inspection Volume in a Wafer
Carl Zeiss SMT GmbH
0 cites
US122887062025
Parameterizing X-ray Scattering Measurement Using Slice-and-image Tomographic Imaging of Semiconductor Structures
Carl Zeiss SMT GmbH
0 cites
US121756502024
Processing Image Data Sets
Carl Zeiss SMT GmbH
0 cites
US121481392024
Methods and Evaluation Devices for Analyzing Three-dimensional Data Sets Representing Devices
Carl Zeiss SMT GmbH
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US120459692024
Automated Root Cause Analysis for Defect Detection During Fabrication Processes of Semiconductor Structures
Carl Zeiss SMT GmbH
0 cites
US119352282024
Method to Acquire a 3D Image of a Sample Structure
Carl Zeiss X-ray Microscopy Inc.
0 cites
US119159082024
Method for Measuring a Sample and Microscope Implementing the Method
Carl Zeiss SMT GmbH
0 cites
US117281302023
Method of Recording an Image Using a Particle Microscope
Carl Zeiss SMT GmbH
0 cites