Patents/Inventors

Jen-shiang Wang

Sunnyvale, CAUS13 patents

11 Patents

US125299662026
Machine Learning Based Image Generation for Model Base Alignments
ASML NETHERLANDS B.V.
0 cites
US125055242025
Method for Training or Using a Process Model for Determining a Pattern in a Patterning Process
ASML NETHERLANDS B.V.
0 cites
US124682322025
Etch Bias Characterization and Method of Using the Same
ASML NETHERLANDS B.V.
0 cites
US122048262025
Method and Apparatus for Inspection and Metrology
ASML NETHERLANDS B.V.
0 cites
US121829832024
Utilize Machine Learning in Selecting High Quality Averaged SEM Images from Raw Images Automatically
ASML NETHERLANDS B.V.
0 cites
US119773362024
Method for Improving a Process for a Patterning Process
ASML NETHERLANDS B.V.
0 cites
US118751012024
Method for Patterning Process Modelling
ASML NETHERLANDS B.V.
0 cites
US116752742023
Etch Bias Characterization and Method of Using the Same
ASML NETHERLANDS B.V.
0 cites
US116146902023
Methods of Tuning Process Models
ASML NETHERLANDS B.V.
0 cites
US115802742023
Method and Apparatus for Inspection and Metrology
ASML NETHERLANDS B.V.
0 cites
US115674132023
Method for Determining Stochastic Variation of Printed Patterns
ASML NETHERLANDS B.V.
0 cites