Jeffrey J. Trgovich

4 Patents

• US125055322025

  Method and Apparatus for Automated Defect Detection

  Sonix, Inc.

  0 cites
• US124984142025

  Unified Measurement System for Static and Dynamic Characterization of a Device Under Test

  Keithley Instruments, LLC

  0 cites
• US120502432024

  Safety Container for High Power Device Testing Over a Range of Temperatures

  Keithley Instruments, LLC

  0 cites
• US117554402023

  User Interface and Method to Configure Sourcing and Measurement Timing

  Keithley Instruments, LLC

  0 cites