Patents/Inventors

Jeffrey Fanton

Los Altos, CAUS1 patent

2 Patents

US123600632025
System and Method for Measuring a Sample by X-ray Reflectance Scatterometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites
US118742372024
System and Method for Measuring a Sample by X-ray Reflectance Scatterometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites