Jeffrey Drue David

5 Patents

• US122299452025

  Wafer Bin Map Based Root Cause Analysis

  PDF Solutions, Inc.

  0 cites
• US119725522024

  Abnormal Wafer Image Classification

  PDF Solutions, Inc.

  0 cites
• US117742352023

  Grouping Spectral Data from Polishing Substrates

  Applied Materials, Inc.

  0 cites
• US117634462023

  Wafer Bin Map Based Root Cause Analysis

  PDF Solutions, Inc.

  0 cites
• US117156722023

  Endpoint Detection for Chemical Mechanical Polishing Based on Spectrometry

  Applied Materials, Inc.

  0 cites