Patents/Inventors

Jeffrey Andresen

Gilroy, CAUS2 patents

3 Patents

US119958022024
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Nanotronics Imaging, Inc.
0 cites
US116637032023
System, Method and Apparatus for Macroscopic Inspection of Reflective Specimens
Nanotronics Imaging, Inc.
0 cites
US116561842023
Macro Inspection Systems, Apparatus and Methods
Nanotronics Imaging, Inc.
0 cites