Patents/Inventors

Jeff Sauer

Danvers, MAUS0 patents

1 Patent

US120446382024
System to Inspect, Modify or Analyze a Region of Interest of a Sample by Charged Particles, Set of Systems to Inspect, Modify or Analyze a Region of Interest of a Sample and Method to Inspect, Modify or Analyze a Region of Interest of a Sample by Charged Particles
Carl Zeiss SMT GmbH
0 cites