Jeeyeon Eom

4 Patents

• US126203282026

  Source Driver Reducing Test Time by Simultaneously Performing Test on the Source Driver and Display Driver Integrated Circuit Including the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US125620872026

  Display Driver Circuit and Defect Testing Method

  Samsung Electronics Co., Ltd.

  0 cites
• US125485052026

  Display Driving Circuit for Optimizing Bias Setting of Source Amplifier and Operating Method of Display Driving Circuit

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US117212622023

  Display Driving Circuit and Display Device Including the Same

  Samsung Electronics Co., Ltd.

  0 cites