Jay T. Scheuer

7 Patents

• US121911132025

  Systems and Methods for Optimizing Full Horizontal Scanned Beam Distance

  Applied Materials, Inc.

  0 cites
• US121547532024

  Device to Control Uniformity of Extracted Ion Beam

  Applied Materials, Inc.

  0 cites
• USD10518382024

  Single-slot Tubular Cathode

  Applied Materials, Inc.

  0 cites
• US118107462023

  Variable Thickness Ion Source Extraction Plate

  Applied Materials, Inc.

  0 cites
• US116519322023

  Mismatched Optics for Angular Control of Extracted Ion Beam

  Applied Materials, Inc.

  0 cites
• US116315672023

  Ion Source with Single-slot Tubular Cathode

  Applied Materials, Inc.

  0 cites
• US115628852023

  Particle Yield via Beam-line Pressure Control

  Applied Materials, Inc.

  0 cites