Jason Osborne

4 Patents

• US117965652023

  AFM Imaging with Metrology-preserving Real Time Denoising

  Bruker Nano, Inc.

  0 cites
• US117141042023

  AFM Imaging with Creep Correction

  Bruker Nano, Inc.

  0 cites
• US116687302023

  High Speed Atomic Force Profilometry of Large Areas

  Bruker Nano, Inc.

  0 cites
• US116042102023

  AFM Imaging with Real Time Drift Correction

  Bruker Nano, Inc.

  0 cites