Patents/Inventors

Jang Jung Lee

HsinchuTW4 patents

5 Patents

US124127292025
Atom Probe Tomography Specimen Preparation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US123745222025
Detection Systems in Semiconductor Metrology Tools
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US118374352023
Atom Probe Tomography Specimen Preparation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US117742412023
Line Edge Roughness Analysis Using Atomic Force Microscopy
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US115667942023
Air Conditioner
SAMSUNG ELECTRONICS CO., Ltd.
0 cites