Patents/Inventors

Jan Sijbers

DuffelBE4 patents

5 Patents

US125000622025
Reconstruction Method for Atom Probe Tomography
IMEC VZW
0 cites
US124718622025
Phase-contrast X-ray Imaging System for Obtaining a Dark-field Image and a Method Therefor
UNIVERSITEIT ANTWERPEN
0 cites
US123500082025
Determination of Parametrized Characteristics of a Tissue
IMEC VZW
0 cites
US119534512024
Item Inspection by Dynamic Selection of Projection Angle
IMEC VZW
0 cites
US119275862024
Item Inspection by Radiation Imaging Using an Iterative Projection-matching Approach
IMEC VZW
0 cites