James M. Tedesco

3 Patents

• US121741222024

  Intensity Calibration of Multipass Raman Systems Using Standard Reference Materials

  Endress+hauser Optical Analysis, Inc.

  0 cites
• US119138342024

  Spatially Offset Raman Probe with Coaxial Excitation and Collection Apertures

  Endress+hauser Optical Analysis, Inc.

  0 cites
• US115923982023

  Augmented Raman Analysis of a Gas Mixture

  Endress+hauser Optical Analysis, Inc.

  0 cites