7 Patents
- US125801662026Two Stage Ion Current Measurement in a Device for Analysis of Plasma Processes
Applied Materials, Inc.
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- US123356662025System and Method of Altering the Appearance of Liquid and Solid Physical Objects or Forms
WET
0 cites - 0 cites
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- US116779162023System and Method of Altering the Appearance of Liquid and Solid Physical Objects or Forms
WET
0 cites