3 Patents
- US124760732025Scanning Electron Microscope Image-based Pitch Walk Inspection Method and Method of Manufacturing Semiconductor Device Comprising the Inspection Method
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US122770262025Error Correction Circuit Capable of Automatically Compensating for Clock Margin and Method of Operating the Same
Samsung Electronics Co., Ltd.
0 cites - US117308502023Indoor Air Cleaning Device for Vehicle Using Non-thermal Plasma and an Operation Method Thereof
KYUNGPOOK NATIONAL UNIVERSITY INDUSTRY-ACADEMIC COOPERATION FOUNDATION
0 cites